دەنگی هاوبەش

SOFC stacks operate at high temperatures for long periods, small degradation effects can gradually accumulate and finally lead to significant voltage decay, efficiency loss, or even stack failure. To address the problem of long computational time in stack simulation, a reduced-order homogenized stack model is developed to retain key electrochemical, thermal, and flow-field gradients while greatly reducing computational cost. By embedding degradation mechanisms into a fast homogenized stack model